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      Developing a viable multilayer coating process for extreme ultraviolet lithography reticles

      Journal of Micro/Nanolithography, MEMS, and MOEMS
      SPIE-Intl Soc Optical Eng

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          Nonspecular x-ray scattering in a multilayer-coated imaging system

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            Smoothing of multilayer x‐ray mirrors by ion polishing

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              Determination of the layered structure in Mo/Si multilayers by grazing incidence X-ray reflectometry

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                Author and article information

                Journal
                Journal of Micro/Nanolithography, MEMS, and MOEMS
                J. Micro/Nanolith. MEMS MOEMS
                SPIE-Intl Soc Optical Eng
                1932-5150
                January 01 2004
                January 01 2004
                : 3
                : 1
                : 139
                Article
                10.1117/1.1631006
                9e1911d8-ab20-4b74-ba81-e7c5b5c7c3b5
                © 2004
                History

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