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      Logic testing of bridging faults in CMOS integrated circuits

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          Test pattern generation using Boolean satisfiability

          T. Larrabee (1992)
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            Inductive Fault Analysis of MOS Integrated Circuits

            F. Ferguson, John Shen, W. Maly (1985)
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              Bridging and Stuck-At Faults

              K.C.Y. Mei (1974)
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                Author and article information

                Journal
                Title: IEEE Transactions on Computers
                Abbreviated Title: IEEE Trans. Comput.
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 00189340
                Publication date (Print): March 1998
                Volume: 47
                Issue: 3
                Pages: 338-345
                Article
                DOI: 10.1109/12.660170
                SO-VID: a12db4f3-9289-4fe3-9380-2eed8ef735a3
                Copyright © © 1998
                History

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