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      Modeling noncontact atomic force microscopy resolution on corrugated surfaces

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          Summary

          Key developments in NC-AFM have generally involved atomically flat crystalline surfaces. However, many surfaces of technological interest are not atomically flat. We discuss the experimental difficulties in obtaining high-resolution images of rough surfaces, with amorphous SiO 2 as a specific case. We develop a quasi-1-D minimal model for noncontact atomic force microscopy, based on van der Waals interactions between a spherical tip and the surface, explicitly accounting for the corrugated substrate (modeled as a sinusoid). The model results show an attenuation of the topographic contours by ~30% for tip distances within 5 Å of the surface. Results also indicate a deviation from the Hamaker force law for a sphere interacting with a flat surface.

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          Electric Field Effect in Atomically Thin Carbon Films

          S. Morozov, K. S. Novoselov, A. K. Geim … (2007)
          We report a naturally-occurring two-dimensional material (graphene that can be viewed as a gigantic flat fullerene molecule, describe its electronic properties and demonstrate all-metallic field-effect transistor, which uniquely exhibits ballistic transport at submicron distances even at room temperature.
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            The structure of suspended graphene sheets

            S. Roth, T. J. Booth, K. S. Novoselov … (2007)
            The recent discovery of graphene has sparked significant interest, which has so far been focused on the peculiar electronic structure of this material, in which charge carriers mimic massless relativistic particle. However, the structure of graphene - a single layer of carbon atoms densely packed in a honeycomb crystal lattice - is also puzzling. On the one hand, graphene appears to be a strictly two-dimensional (2D) material and exhibits such a high crystal quality that electrons can travel submicron distances without scattering. On the other hand, perfect 2D crystals cannot exist in the free state, according to both theory and experiment. This is often reconciled by the fact that all graphene structures studied so far were an integral part of larger 3D structures, either supported by a bulk substrate or embedded in a 3D matrix. Here we report individual graphene sheets freely suspended on a microfabricated scaffold in vacuum or air. These membranes are only one atom thick and still display a long-range crystalline order. However, our studies by transmission electron microscopy (TEM) have revealed that suspended graphene sheets are not perfectly flat but exhibit intrinsic microscopic roughening such that the surface normal varies by several degrees and out-of-plane deformations reach 1 nm. The atomically-thin single-crystal membranes offer an ample scope for fundamental research and new technologies whereas the observed corrugations in the third dimension may shed light on subtle reasons behind the stability of 2D crystals.
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              Frictional characteristics of atomically thin sheets.

              Changgu Lee, Qunyang Li, William Kalb … (2010)
              Using friction force microscopy, we compared the nanoscale frictional characteristics of atomically thin sheets of graphene, molybdenum disulfide (MoS2), niobium diselenide, and hexagonal boron nitride exfoliated onto a weakly adherent substrate (silicon oxide) to those of their bulk counterparts. Measurements down to single atomic sheets revealed that friction monotonically increased as the number of layers decreased for all four materials. Suspended graphene membranes showed the same trend, but binding the graphene strongly to a mica surface suppressed the trend. Tip-sample adhesion forces were indistinguishable for all thicknesses and substrate arrangements. Both graphene and MoS2 exhibited atomic lattice stick-slip friction, with the thinnest sheets possessing a sliding-length-dependent increase in static friction. These observations, coupled with finite element modeling, suggest that the trend arises from the thinner sheets' increased susceptibility to out-of-plane elastic deformation. The generality of the results indicates that this may be a universal characteristic of nanoscale friction for atomically thin materials weakly bound to substrates.
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                Author and article information

                Contributors
                William G Cullen
                Udo D Schwarz: Role: Guest Editor
                Journal
                Journal ID (nlm-ta): Beilstein J Nanotechnol
                Journal ID (iso-abbrev): Beilstein J Nanotechnol
                Title: Beilstein Journal of Nanotechnology
                Publisher: Beilstein-Institut (Trakehner Str. 7-9, 60487 Frankfurt am Main, Germany )
                ISSN (Electronic): 2190-4286
                Publication date Collection: 2012
                Publication date (Electronic): 13 March 2012
                Volume: 3
                Pages: 230-237
                Affiliations
                [1 ]Materials Research Science and Engineering Center, Department of Physics, University of Maryland, College Park, Maryland 20742-4111, USA
                [2 ]Center for Nanophysics and Advanced Materials, Department of Physics, University of Maryland, USA
                Article
                DOI: 10.3762/bjnano.3.26
                PMC ID: 3323912
                PubMed ID: 22496996
                SO-VID: a2b723d9-3f9e-48ab-bde2-66204fbf0134
                Copyright © Copyright © 2012, Burson et al; licensee Beilstein-Institut.
                License:

                This is an Open Access article under the terms of the Creative Commons Attribution License ( http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

                The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: ( http://www.beilstein-journals.org/bjnano)

                History
                Date received : 29 November 2011
                Date accepted : 16 February 2012
                Categories
                Subject: Full Research Paper
                Subject: Nanoscience
                Subject: Nanotechnology

                Keywords: graphene,model,noncontact atomic force microscopy,sio2,van der waals
                Data availability:
                Keywords: graphene, model, noncontact atomic force microscopy, sio2, van der waals

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