Critical thickness and nanoporosity of TiO2 optical thin films

Ferrer, Javier; ALVAREZ, Rafael Herrera; Borras, Ana; González-Elipe, Agustin R.; Sanchez-Valencia, Juan Ramon

doi:10.1016/j.micromeso.2012.04.035

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Critical thickness and nanoporosity of TiO2 optical thin films

Author(s): Ana Borras , Rafael Alvarez , Juan R. Sanchez-Valencia , Javier Ferrer , Agustin R. Gonzalez-Elipe

Publication date Created: September 2012

Publication date (Print): September 2012

Journal: Microporous and Mesoporous Materials

Publisher: Elsevier BV

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WSXM: a software for scanning probe microscopy and a tool for nanotechnology.

I Horcas, R FERNÁNDEZ, J. M. Gómez-Rodríguez … (2007)

In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.