3
views
0
recommends
+1 Recommend
0 collections
    0
    shares
      • Record: found
      • Abstract: found
      • Article: found
      Is Open Access

      APRF: Anti-Aliasing Projection Representation Field for Inverse Problem in Imaging

      Preprint
      , , ,

      Read this article at

      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Abstract

          Sparse-view Computed Tomography (SVCT) reconstruction is an ill-posed inverse problem in imaging that aims to acquire high-quality CT images based on sparsely-sampled measurements. Recent works use Implicit Neural Representations (INRs) to build the coordinate-based mapping between sinograms and CT images. However, these methods have not considered the correlation between adjacent projection views, resulting in aliasing artifacts on SV sinograms. To address this issue, we propose a self-supervised SVCT reconstruction method -- Anti-Aliasing Projection Representation Field (APRF), which can build the continuous representation between adjacent projection views via the spatial constraints. Specifically, APRF only needs SV sinograms for training, which first employs a line-segment sampling module to estimate the distribution of projection views in a local region, and then synthesizes the corresponding sinogram values using center-based line integral module. After training APRF on a single SV sinogram itself, it can synthesize the corresponding dense-view (DV) sinogram with consistent continuity. High-quality CT images can be obtained by applying re-projection techniques on the predicted DV sinograms. Extensive experiments on CT images demonstrate that APRF outperforms state-of-the-art methods, yielding more accurate details and fewer artifacts. Our code will be publicly available soon.

          Related collections

          Author and article information

          Journal
          11 July 2023
          Article
          2307.05270
          b85baecc-3959-4a70-b0b8-e4c54a51475c

          http://arxiv.org/licenses/nonexclusive-distrib/1.0/

          History
          Custom metadata
          eess.IV cs.CV

          Computer vision & Pattern recognition,Electrical engineering
          Computer vision & Pattern recognition, Electrical engineering

          Comments

          Comment on this article