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      Characterization of the mechanical properties of qPlus sensors

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          Summary

          In this paper we present a comparison of three different methods that can be used for estimating the stiffness of qPlus sensors. The first method is based on continuum theory of elasticity. The second (Cleveland’s method) uses the change in the eigenfrequency that is induced by the loading of small masses. Finally, the stiffness is obtained by analysis of the thermal noise spectrum. We show that all three methods give very similar results. Surprisingly, neither the gold wire nor the gluing give rise to significant changes of the stiffness in the case of our home-built sensors. Furthermore we describe a fast and cost-effective way to perform Cleveland’s method. This method is based on gluing small pieces of a tungsten wire; the mass is obtained from the volume of the wire, which is measured by optical microscopy. To facilitate detection of oscillation eigenfrequencies under ambient conditions, we designed and built a device for testing qPlus sensors.

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          Most cited references36

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          Atomic Force Microscope

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            Surface Studies by Scanning Tunneling Microscopy

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              Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.

              Achieving high resolution under ultrahigh-vacuum conditions with the force microscope can be difficult for reactive surfaces, where the interaction forces between the tip and the samples can be relatively large. A force detection scheme that makes use of a modified cantilever beam and senses the force gradient through frequency modulation is described. The reconstructed silicon (111)-(7x7) surface was imaged in a noncontact mode by force microscopy with atomic resolution (6 angstroms lateral, 0.1 angstrom vertical).
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                Author and article information

                Contributors
                Role: Guest Editor
                Role: Guest Editor
                Journal
                Beilstein J Nanotechnol
                Beilstein J Nanotechnol
                Beilstein Journal of Nanotechnology
                Beilstein-Institut (Trakehner Str. 7-9, 60487 Frankfurt am Main, Germany )
                2190-4286
                2013
                2 January 2013
                : 4
                : 1-9
                Affiliations
                [1 ]Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnicka 10, 162 53, Prague, Czech Republic
                Article
                10.3762/bjnano.4.1
                3566797
                23399836
                d259be86-3d0b-4b42-8330-a9dadcaf5afa
                Copyright © 2013, Berger et al; licensee Beilstein-Institut.

                This is an Open Access article under the terms of the Creative Commons Attribution License ( http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

                The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: ( http://www.beilstein-journals.org/bjnano)

                History
                : 14 September 2012
                : 28 November 2012
                Categories
                Full Research Paper
                Nanoscience
                Nanotechnology

                afm,cleveland’s method,cross talk,force,qplus,stiffness,stm,thermal noise,tuning fork

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