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      Dependence of Electromigration‐Induced Failure Time on Length and Width of Aluminum Thin‐Film Conductors

      Author(s): , ,
      Publication date Created:
      Publication date (Print):
      Journal: Journal of Applied Physics
      Publisher: AIP Publishing

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          Current-induced marker motion in gold wires

          A.R. Grone, H.B. Huntington (1961)
          Article 0 comments Cited 143 times – based on 0 reviews     Review now
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            RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMS

            R. Rosenberg, L. Berenbaum (1968)
            Article 0 comments Cited 48 times – based on 0 reviews     Review now
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              Electromigration in Thin Al Films

              I. A. Blech, E. S. Meieran (1969)
              Article 0 comments Cited 39 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Journal of Applied Physics
                Abbreviated Title: Journal of Applied Physics
                Publisher: AIP Publishing
                ISSN (Print): 0021-8979
                ISSN (Electronic): 1089-7550
                Publication date Created: September 1970
                Publication date (Print): September 1970
                Volume: 41
                Issue: 10
                Pages: 3954-3960
                Article
                DOI: 10.1063/1.1658395
                SO-VID: e92483fd-3361-49ca-90f4-318229eab9c2
                Copyright © © 1970
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