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      Precise determination of force microscopy cantilever stiffness from dimensions and eigenfrequencies

      Author(s): , ,
      Publication date Created:
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      Journal: Measurement Science and Technology
      Publisher: IOP Publishing

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          What is the Young's Modulus of Silicon?

          Matthew A. Hopcroft, William D. Nix, Thomas W. Kenny (2010)
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            A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy

            J. P. Cleveland, S Manne, D. Bocek … (1993)
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              Young's Modulus, Shear Modulus, and Poisson's Ratio in Silicon and Germanium

              J. J. Wortman, R Evans (1965)
              Article 0 comments Cited 204 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Measurement Science and Technology
                Abbreviated Title: Meas. Sci. Technol.
                Publisher: IOP Publishing
                ISSN (Print): 0957-0233
                ISSN (Electronic): 1361-6501
                Publication date Created: April 01 2012
                Publication date (Print): April 01 2012
                Volume: 23
                Issue: 4
                Page: 045401
                Article
                DOI: 10.1088/0957-0233/23/4/045401
                SO-VID: f3835862-2db1-4232-a44f-ba6e1db8c6b7
                Copyright © © 2012
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