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      Reduced Lasing Thresholds in GeSn Microdisk Cavities with Defect Management of the Optically Active Region

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          Most cited references47

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          Lasing in direct-bandgap GeSn alloy grown on Si

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            Achieving direct band gap in germanium through integration of Sn alloying and external strain

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              Increased photoluminescence of strain-reduced, high-Sn composition Ge1−xSnx alloys grown by molecular beam epitaxy

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                Author and article information

                Contributors
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                Journal
                ACS Photonics
                ACS Photonics
                American Chemical Society (ACS)
                2330-4022
                2330-4022
                October 21 2020
                September 01 2020
                October 21 2020
                : 7
                : 10
                : 2713-2722
                Affiliations
                [1 ]Université Paris-Saclay, CNRS, C2N, 91120, Palaiseau, France
                [2 ]STMicroelectronics, Rue Jean Monnet 38054 Crolles, France
                [3 ]LPICM, CNRS, Ecole Polytechnique, Université Paris-Saclay, 91120 Palaiseau, France
                [4 ]Univ. Grenoble Alpes, CEA, IRIG-DePhy, 38054 Grenoble, France
                [5 ]Univ. Grenoble Alpes, CEA, LETI, 38054 Grenoble, France
                [6 ]Université Côte d’Azur, CNRS, CRHEA, Rue Bernard Grégory, CS 10269, 06905 Sophia-Antipolis Cedex, France
                Article
                10.1021/acsphotonics.0c00708
                ff8d3430-5a4c-458e-be61-65236c142739
                © 2020

                https://doi.org/10.15223/policy-029

                https://doi.org/10.15223/policy-037

                https://doi.org/10.15223/policy-045

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