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Transmission Electron Microscopy
other
Author(s):
David B. Williams
,
C. Barry Carter
Publication date
(Print):
2009
Publisher:
Springer US
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Atomic Force Microscopy
Author and book information
Book
ISBN (Print):
978-0-387-76500-6
ISBN (Electronic):
978-0-387-76501-3
Publication date (Print):
2009
DOI:
10.1007/978-0-387-76501-3
SO-VID:
add60500-e38d-439a-a0aa-3dd286cfdfd8
License:
http://www.springer.com/tdm
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Book chapters
pp. 3
The Transmission Electron Microscope
pp. 23
Scattering and Diffraction
pp. 39
Elastic Scattering
pp. 53
Inelastic Scattering and Beam Damage
pp. 73
Electron Sources
pp. 91
Lenses, Apertures, and Resolution
pp. 115
How to ‘See’ Electrons
pp. 127
Pumps and Holders
pp. 141
The Instrument
pp. 173
Specimen Preparation
pp. 197
Diffraction in TEM
pp. 211
Thinking in Reciprocal Space
pp. 221
Diffracted Beams
pp. 235
Bloch Waves
pp. 245
Dispersion Surfaces
pp. 257
Diffraction from Crystals
pp. 271
Diffraction from Small Volumes
pp. 283
Obtaining and Indexing Parallel-Beam Diffraction Patterns
pp. 311
Kikuchi Diffraction
pp. 323
Obtaining CBED Patterns
pp. 347
Using Convergent-Beam Techniques
pp. 371
Amplitude Contrast
pp. 389
Phase-Contrast Images
pp. 407
Thickness and Bending Effects
pp. 419
Planar Defects
pp. 441
Imaging Strain Fields
pp. 463
Weak-Beam Dark-Field Microscopy
pp. 483
High-Resolution TEM
pp. 511
Other Imaging Techniques
pp. 533
Image Simulation
pp. 549
Processing and Quantifying Images
pp. 581
X-ray Spectrometry
pp. 605
X-ray Spectra and Images
pp. 625
Qualitative X-ray Analysis and Imaging
pp. 639
Quantitative X-ray Analysis
pp. 663
Spatial Resolution and Minimum Detection
pp. 679
Electron Energy-Loss Spectrometers and Filters
pp. 699
Low-Loss and No-Loss Spectra and Images
pp. 715
High Energy-Loss Spectra and Images
pp. 741
Fine Structure and Finer Details
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