- Record: found
- Abstract: not found
- Article: not found
Interface states and electron spin resonance centers in thermally oxidized (111) and (100) silicon wafers
February 1981
February 1981
Read this article at
There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
Related collections
Most cited references10
- Record: found
- Abstract: not found
- Article: not found
ESR centers, interface states, and oxide fixed charge in thermally oxidized silicon wafers
Bruce Deal, Philip Caplan, Edward H. Poindexter … (1979)
- Record: found
- Abstract: not found
- Article: not found
Study of Silicon-Silicon Dioxide Structure by Electron Spin Resonance I
Yoshio Nishi (1971)
- Record: found
- Abstract: not found
- Article: not found
Observation and analysis of the primary 29Si hyperfine structure of the E′ center in non-crystalline SiO2
E.J. Friebele, G.H. Sigel, D.L. Griscom (1974)