ScienceOpen:
research and publishing network
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
My ScienceOpen
Sign in
Register
Dashboard
Blog
About
Search
Advanced search
My ScienceOpen
Sign in
Register
Dashboard
Search
Search
Advanced search
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
Blog
About
Done
Inviting an author to review:
Inferring average generation via division-linked labeling
Find an author and click ‘
Invite to review selected article
’ near their name.
Search for authors
Search for similar articles
Invite by email
3
views
0
references
Top references
cited by
0
Cite as...
0 reviews
Review
0
comments
Comment
0
recommends
+1
Recommend
0
collections
Add to
0
shares
Share
Twitter
Sina Weibo
Facebook
Email
3,488
similar
All similar
Record
: found
Abstract
: not found
Article
: not found
Modeling of Surface Potential of Cylindrical Surrounding Gate MOSFET’s Including Fringing Field Effects
Author(s):
N.P. Maity
,
Reshmi Maity
Publication date
Created:
2018
Publication date
(Print):
2018
Journal:
Materials Today: Proceedings
Publisher:
Elsevier BV
Read this article at
ScienceOpen
Publisher
Review
Review article
Invite someone to review
Bookmark
Cite as...
There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
Related collections
Reviews of mathematical modeling in cancer
Author and article information
Journal
Title:
Materials Today: Proceedings
Abbreviated Title:
Materials Today: Proceedings
Publisher:
Elsevier BV
ISSN (Print):
22147853
Publication date Created:
2018
Publication date (Print):
2018
Volume
: 5
Issue
: 7
Pages
: 15218-15223
Article
DOI:
10.1016/j.matpr.2018.04.086
SO-VID:
0d3f6f04-ac6b-46c8-9136-5d5e22d62f0b
Copyright ©
© 2018
License:
https://www.elsevier.com/tdm/userlicense/1.0/
History
Data availability:
Comments
Comment on this article
Sign in to comment
scite_
Similar content
3,488
A new scaling theory for fully-depleted SOI double-gate MOSFET’s: including effective conducting path effect (ECPE)
Authors:
T.K Chiang
Random Berry phase magnetoresistance as a probe of interface roughness in Si MOSFET’s
Authors:
H Mathur
,
Harold Baranger
Reliability analysis of power MOSFET’s with the help of compact models and circuit simulation
Authors:
A. Castellazzi
,
R. Kraus
,
N Seliger
…
See all similar