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      Defect-enhanced annealing by carrier recombination in GaAs

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      Physical Review B
      American Physical Society (APS)

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          Irradiation-induced defects in GaAs

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            Point Defects in Semiconductors I

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              Point Defects in Semiconductors II

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                Author and article information

                Journal
                PRBMDO
                Physical Review B
                Phys. Rev. B
                American Physical Society (APS)
                0163-1829
                June 1986
                June 15 1986
                : 33
                : 12
                : 8410-8415
                Article
                10.1103/PhysRevB.33.8410
                11e349d2-be4e-41c3-a8c3-8710ab6880f5
                © 1986

                http://link.aps.org/licenses/aps-default-license

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