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      Scanning electron microscope observation of single defects in solid crystalline materials : Observation of Single Defects in Crystals

      Author(s): , , ,
      Publication date (Electronic):
      Journal: Scanning
      Publisher: Wiley

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          Effects of surface stress relaxation on the electron microscope images of dislocations normal to thin metal foils

          P. B. Hirsch, J. Steeds, W. J. Tunstall (1964)
          Article 0 comments Cited 29 times – based on 0 reviews     Review now
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            Low‐Loss Image for Surface Scanning Electron Microscope

            Oliver Wells (1971)
            Article 0 comments Cited 28 times – based on 0 reviews     Review now
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              Electron–channelling imaging in scanning electron microscopy

              G. Fontaine, D. Besnard, M. Pitaval … (1979)
              Article 0 comments Cited 23 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Journal ID (publisher-id): SCA
                Title: Scanning
                Abbreviated Title: Scanning
                Publisher: Wiley
                ISSN: 01610457
                Publication date Created: 1979
                Publication date (Print): 1979
                Publication date (Electronic): August 09 2011
                Volume: 2
                Issue: 4
                Pages: 217-224
                Article
                DOI: 10.1002/sca.4950020403
                SO-VID: 46b7be47-a992-4cd4-9bdc-805fe89bc347
                Copyright © © 2011
                License:

                http://doi.wiley.com/10.1002/tdm_license_1.1

                http://onlinelibrary.wiley.com/termsAndConditions#vor

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