Title:
IEEE Transactions on Reliability
Abbreviated Title:
IEEE Trans. Rel.
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
ISSN
(Print):
0018-9529
Publication date Created:
December
2004
Publication date
(Print):
December
2004
Volume: 53
Issue: 4
Pages: 465-480
Article
DOI: 10.1109/TR.2004.838034
SO-VID: 524a8425-e66a-494c-9ac7-14ea9ed65638
Copyright © ©
2004