Reliability and degradation mechanism of AlGaAs/InGaAs and InAlAs/InGaAs HEMTs

Dammann, M.; Leuther, A.; Benkhelifa, F.; Feltgen, T.; Jantz, W.

doi:10.1002/pssa.200306303

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Reliability and degradation mechanism of AlGaAs/InGaAs and InAlAs/InGaAs HEMTs

Author(s): M. Dammann , A. Leuther , F. Benkhelifa , T. Feltgen , W. Jantz

Publication date Created: January 2003

Publication date (Print): January 2003

Journal: physica status solidi (a)

Publisher: Wiley

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Title: physica status solidi (a)

Abbreviated Title: phys. stat. sol. (a)

Publisher: Wiley

ISSN (Print): 0031-8965

ISSN (Electronic): 1521-396X

Publication date Created: January 2003

Publication date (Print): January 2003

Volume: 195

Issue: 1

Pages: 81-86

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DOI: 10.1002/pssa.200306303

SO-VID: 7760b95c-552e-46a0-af37-fd0a9cce8331

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http://doi.wiley.com/10.1002/tdm_license_1.1

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Reliability and degradation mechanism of AlGaAs/InGaAs and InAlAs/InGaAs HEMTs

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