For Publishers
DiscoveryMetadataPeer reviewHostingPublishing
For Researchers
JoinPublishReviewCollect
Register
Blog
About
Search
Advanced search
My ScienceOpen
Search
For Publishers
For Researchers
Blog
About
13
views
19
references
 Top references
cited by
76
    
0 reviews
 Review
0
comments
 Comment
0
recommends
+1 Recommend
0 collections
    0
    shares
      3,065
      similar
       All similar
      • Record: found
      • Abstract: not found
      • Article: not found

      Conditions and reasons for incoherent imaging in STEM

      Author(s): , ,
      Publication date Created:
      Publication date (Print):
      Journal: Ultramicroscopy
      Publisher: Elsevier BV

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references19

          • Record: found
          • Abstract: not found
          • Article: not found

          Relativistic Hartree–Fock X-ray and electron scattering factors

          P. Doyle, P. S. Turner (1968)
          Article 0 comments Cited 216 times – based on 0 reviews     Review now
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            High-resolution Z-contrast imaging of crystals

            S.J. Pennycook, D.E. Jesson (1991)
            Article 0 comments Cited 131 times – based on 0 reviews     Review now
              Bookmark
              • Record: found
              • Abstract: found
              • Article: not found

              Visibility of single atoms.

              J P Langmore, A Crewe, Richard Wall (1970)
              Theoretical and experimental studies indicate that, with a high-resolution scanning electron microscope, it is now possible to obtain pictures of a single heavy atom resting on a thin carbon substrate.
              Article 0 comments Cited 129 times – based on 0 reviews     Review now
                Bookmark
                All references

                Author and article information

                Journal
                Title: Ultramicroscopy
                Abbreviated Title: Ultramicroscopy
                Publisher: Elsevier BV
                ISSN (Print): 03043991
                Publication date Created: June 1996
                Publication date (Print): June 1996
                Volume: 63
                Issue: 2
                Pages: 93-114
                Article
                DOI: 10.1016/0304-3991(96)00020-4
                SO-VID: 81c01c13-6fce-44a5-99be-f59994ef09ed
                Copyright © © 1996
                License:

                http://www.elsevier.com/tdm/userlicense/1.0/

                History

                Data availability:

                Comments

                Comment on this article

                scite_

                Similar content3,065

                See all similar

                Cited by73

                See all cited by

                Most referenced authors78

                See all reference authors