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      Journal: Journal of Applied Physics
      Publisher: AIP Publishing

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          Microscopic structure of theSiO2/Si interface

          F. McFeely, F Himpsel, G. Hollinger … (1988)
          Article 0 comments Cited 370 times – based on 0 reviews     Review now
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            Optical properties of non-crystalline Si, SiO, SiOx and SiO2

            H.R. Philipp (1971)
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              Dielectric breakdown in electrically stressed thin films of thermal SiO2

              Eli Harari (1978)
              Article 0 comments Cited 136 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Journal ID (publisher-id): JAPIAU
                Title: Journal of Applied Physics
                Publisher: AIP Publishing
                ISSN (Print): 0021-8979
                ISSN (Electronic): 1089-7550
                Publication date Created: May 01 1996
                Publication date (Print): May 01 1996
                Volume: 79
                Issue: 9
                Pages: 6653-6713
                Article
                DOI: 10.1063/1.362676
                SO-VID: 9da7442a-339f-4a69-88e8-4974ea24e3c9
                Copyright © © 1996
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