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      Growth, structure, and performance of depth-graded W/Si multilayers for hard x-ray optics

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          Influence of apparatus geometry and deposition conditions on the structure and topography of thick sputtered coatings

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            Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates

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              IMD—Software for modeling the optical properties of multilayer films

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                July 2000
                July 2000
                : 88
                : 1
                : 460-470
                Article
                10.1063/1.373681
                c3110b4f-7d41-4b1e-acc7-7ec15c84b442
                © 2000
                History

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