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Kelvin probe force microscopy

Author(s): H. Wickramasinghe, M Nonnenmacher, M. P. O’Boyle

Publication date: 1991

Journal: Applied physics letters

Publisher: AIP Publishing

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Most cited references 12

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Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

Y Martin, C Williams, H. Wickramasinghe (1987)

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High‐resolution capacitance measurement and potentiometry by force microscopy

Yves Martin, H Kumar Wickramasinghe, David W. Abraham (1988)

0 comments Cited 161 times – based on 0 reviews      Review now

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Deposition and imaging of localized charge on insulator surfaces using a force microscope

B. Terris, H J Mamin, D Rugar … (1988)

0 comments Cited 105 times – based on 0 reviews      Review now

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DOI:: 10.1063/1.105227

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