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2,772
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Kelvin probe force microscopy
Author(s):
H. Wickramasinghe
,
M Nonnenmacher
,
M. P. O’Boyle
Publication date:
1991
Journal:
Applied physics letters
Publisher:
AIP Publishing
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Atomic Force Microscopy
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12
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Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
Y Martin
,
C Williams
,
H. Wickramasinghe
(1987)
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High‐resolution capacitance measurement and potentiometry by force microscopy
Yves Martin
,
H Kumar Wickramasinghe
,
David W. Abraham
(1988)
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Deposition and imaging of localized charge on insulator surfaces using a force microscope
B. Terris
,
H J Mamin
,
D Rugar
…
(1988)
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Journal
DOI::
10.1063/1.105227
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