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      Kelvin probe force microscopy

      Applied physics letters
      AIP Publishing

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          Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

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            High‐resolution capacitance measurement and potentiometry by force microscopy

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              Deposition and imaging of localized charge on insulator surfaces using a force microscope

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                Journal
                10.1063/1.105227

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