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      Efficient Particle Filter Localization Algorithm in Dense Passive RFID Tag Environment

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          Simultaneous localization and mapping: part I

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            Simultaneous localization and mapping (SLAM): part II

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              Data association in stochastic mapping using the joint compatibility test

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                Author and article information

                Journal
                IEEE Transactions on Industrial Electronics
                IEEE Trans. Ind. Electron.
                Institute of Electrical and Electronics Engineers (IEEE)
                0278-0046
                1557-9948
                October 2014
                October 2014
                : 61
                : 10
                : 5641-5651
                Article
                10.1109/TIE.2014.2301737
                © 2014
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