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Secondary electron emission in the scanning electron microscope
Author(s):
H Seiler
Publication date
Created:
November 1983
Publication date
(Print):
November 1983
Journal:
Journal of Applied Physics
Publisher:
AIP Publishing
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Electron Channelling Contrast Imaging (ECCI)
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75
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Charge collection scanning electron microscopy
H. Leamy
(1982)
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Secondary Electron Emission from Solids
O. Hachenberg
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W. Brauer
(1959)
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Wide-band detector for micro-microampere low-energy electron currents
T E Everhart
,
R F M Thornley
(1960)
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Author and article information
Journal
Title:
Journal of Applied Physics
Abbreviated Title:
Journal of Applied Physics
Publisher:
AIP Publishing
ISSN (Print):
0021-8979
ISSN (Electronic):
1089-7550
Publication date Created:
November 1983
Publication date (Print):
November 1983
Volume
: 54
Issue
: 11
Pages
: R1-R18
Article
DOI:
10.1063/1.332840
SO-VID:
908b4ef7-f4a5-4beb-9b67-9aad35ae13da
Copyright ©
© 1983
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