Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt, Hans-Jürgen; Cappella, Brunero; Kappl, Michael

doi:10.1016/j.surfrep.2005.08.003

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Force measurements with the atomic force microscope: Technique, interpretation and applications

Author(s): Hans-Jürgen Butt , Brunero Cappella , Michael Kappl

Publication date Created: October 2005

Publication date (Print): October 2005

Journal: Surface Science Reports

Publisher: Elsevier BV

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Journal

Title: Surface Science Reports

Abbreviated Title: Surface Science Reports

Publisher: Elsevier BV

ISSN (Print): 01675729

Publication date Created: October 2005

Publication date (Print): October 2005

Volume: 59

Issue: 1-6

Pages: 1-152

Article

DOI: 10.1016/j.surfrep.2005.08.003

SO-VID: 9dc658d4-cf7d-4073-a9da-f78b5cfbc277

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Yang Gan added an editorial note to Atomic Force Microscopy

An authorative, comprehensive and well-cited review on AFM force measurements by one of leading scientiests (Butt) on surface and interface studies and his colleagues.

2016-02-29 07:37 UTC

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