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      Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

      Author(s): ,
      Publication date Created:
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      Journal: Applied Physics Letters
      Publisher: AIP Publishing

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          Atomic Force Microscope

          G. Binnig, C Quate, Andreas Gerber (1987)
          Article 0 comments Cited 2165 times – based on 0 reviews     Review now
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            Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

            Y Martin, C Williams, H. Wickramasinghe (1987)
            Article 0 comments Cited 324 times – based on 0 reviews     Review now
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              Polarized Electron Probes of Magnetic Surfaces

              R Celotta, D Pierce (1986)
              Article 0 comments Cited 25 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Applied Physics Letters
                Abbreviated Title: Appl. Phys. Lett.
                Publisher: AIP Publishing
                ISSN (Print): 0003-6951
                ISSN (Electronic): 1077-3118
                Publication date Created: May 18 1987
                Publication date (Print): May 18 1987
                Volume: 50
                Issue: 20
                Pages: 1455-1457
                Article
                DOI: 10.1063/1.97800
                SO-VID: 454547db-03f4-4350-bec4-90f0ea61920e
                Copyright © © 1987
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