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      Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

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      Applied Physics Letters
      AIP Publishing

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          Atomic Force Microscope

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            Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

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              Polarized Electron Probes of Magnetic Surfaces

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                May 18 1987
                May 18 1987
                : 50
                : 20
                : 1455-1457
                Article
                10.1063/1.97800
                454547db-03f4-4350-bec4-90f0ea61920e
                © 1987
                History

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